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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Polarity-dependent oxide breakdown of NFET devices for ultra-thin gate oxide
Wu, E., Lai, W., Khare, M., Sune, J., Han, L.-K., McKenna, J., Bolam, R., Harmon, D., Strong, A.Year:
2002
Language:
english
DOI:
10.1109/relphy.2002.996611
File:
PDF, 919 KB
english, 2002