The Effect of Thermal Shocks on the Stresses in a Sapphire Wafer
Vodenitcharova, T., Zhang, L. C., Zarudi, I., Yin, Y., Domyo, H., Ho, T.Volume:
19
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2006.883591
Date:
November, 2006
File:
PDF, 240 KB
english, 2006