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[IEEE 2012 Annual Reliability and Maintainability Symposium (RAMS) - Reno, NV, USA (2012.01.23-2012.01.26)] 2012 Proceedings Annual Reliability and Maintainability Symposium - On planning accelerated life tests for comparing two product designs
Guo, Huairui, Niu, Pengying, Mettas, Adamantios, Ogden, DougYear:
2012
Language:
english
DOI:
10.1109/rams.2012.6175507
File:
PDF, 449 KB
english, 2012