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[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - A modern look at the CMOS stuck-open fault
Gomez, Roberto, Champac, Victor, Hawkins, Chuck, Segura, JaumeYear:
2009
Language:
english
DOI:
10.1109/latw.2009.4813818
File:
PDF, 419 KB
english, 2009