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[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Impact of transistor aging effects on sense amplifier reliability in nano-scale CMOS
Menchaca, Roberto, Mahmoodi, HamidYear:
2012
Language:
english
DOI:
10.1109/isqed.2012.6187515
File:
PDF, 368 KB
english, 2012