[IEEE Comput. Soc. Press 14th VLSI Test Symposium -...

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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Dynamic diagnosis of sequential circuits based on stuck-at faults

Venkataraman, S., Hartanto, I., Kent Fuchs, W.
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Year:
1996
Language:
english
DOI:
10.1109/vtest.1996.510858
File:
PDF, 591 KB
english, 1996
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