[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - Dynamic diagnosis of sequential circuits based on stuck-at faults
Venkataraman, S., Hartanto, I., Kent Fuchs, W.Year:
1996
Language:
english
DOI:
10.1109/vtest.1996.510858
File:
PDF, 591 KB
english, 1996