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[IEEE 2010 2nd Asia Symposium on Quality Electronic Design (ASQED 2010) - Penang, Malaysia (2010.08.3-2010.08.4)] 2nd Asia Symposium on Quality Electronic Design (ASQED) - Statistical leakage estimation for DRAM circuits

Lee, Hyungwoo, So, Heejung, Jung, Seungho, Hwang, Chanseok, Lee, Jongbae, Yoo, Moonhyun
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Year:
2010
Language:
english
DOI:
10.1109/asqed.2010.5548246
File:
PDF, 478 KB
english, 2010
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