[IEEE 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW) - Scottsdale, AZ, USA (2009.06.10-2009.06.12)] 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop - ADC non-linearity low-cost test through a simplified Double-Histogram method
Jalon, M. A., Peralias, E.Year:
2009
Language:
english
DOI:
10.1109/ims3tw.2009.5158686
File:
PDF, 638 KB
english, 2009