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[IEEE 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - New York, NY, USA (17-22 June 2006)] 2006 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'06) - A Comparison of 3D Biometric Modalities
Woodard, D.L., Faltemier, T.C., Ping Yan,, Flynn, P.J., Bowyer, K.W.Year:
2006
Language:
english
DOI:
10.1109/cvprw.2006.12
File:
PDF, 1.62 MB
english, 2006