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[IEEE 2012 International Conference on Optoelectronics and Microelectronics (ICOM) - Changchun, Jilin, China (2012.08.23-2012.08.25)] 2012 International Conference on Optoelectronics and Microelectronics - New algorithm of measuring the cone section with the coordinate machine measurement
Wang, Enguo, Gao, Yinhan, Su, Chengzhi, Yu, Peizhang, Jiang, Mingyi, Liu, YangYear:
2012
Language:
english
DOI:
10.1109/icoom.2012.6316311
File:
PDF, 687 KB
english, 2012