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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - An Enhanced EDAC Methodology for Low Power PSRAM
Chen, Po-yuan, Yeh, Yi-ting, Chen, Chao-hsun, Yeh, Jen-chieh, Wu, Cheng-wen, Lee, Jeng-shen, Lin, Yu-changYear:
2006
Language:
english
DOI:
10.1109/test.2006.297689
File:
PDF, 11.18 MB
english, 2006