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[IEEE 2013 5th Asia Symposium on Quality Electronic Design (ASQED) - Penang, Malaysia (2013.08.26-2013.08.28)] Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) - Improved test methodology for multi-clock domain SoC ATPG testing
Ooi, Ee Mei, Ang, Chin HaiYear:
2013
Language:
english
DOI:
10.1109/asqed.2013.6643560
File:
PDF, 370 KB
english, 2013