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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Gate oxide multiple soft breakdown (Multi-SBD) impact on CMOS inverter
Huey-Ming Huang,, Ko, C.Y., Yang, M.L., Liao, P.J., Wang, J.J., Oates, A., Wu, K.Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315405
File:
PDF, 154 KB
english, 2004