![](/img/cover-not-exists.png)
[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Automatic SoC Level Test Path Synthesis Based on Partial Functional Models
Tsertov, Anton, Ubar, Raimund, Jutman, Artur, Devadze, SergeiYear:
2011
Language:
english
DOI:
10.1109/ats.2011.79
File:
PDF, 331 KB
english, 2011