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[IEEE 15th International Conference on Advanced Computing and Communications (ADCOM 2007) - Guwahati, Assam, India (2007.12.18-2007.12.21)] 15th International Conference on Advanced Computing and Communications (ADCOM 2007) - A New Approach for Test Pattern Generation for Digital Cores in Mixed Signal Circuits
Rajaneesh, M., Bhattacharya, R., Biswas, S., Mukhopadhyay, S., Patra, A.Year:
2007
Language:
english
DOI:
10.1109/adcom.2007.119
File:
PDF, 594 KB
english, 2007