[IEEE 2009 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Traverse City, MI, USA (2009.06.2-2009.06.5)] 2009 IEEE Nanotechnology Materials and Devices Conference - Accurate estimation of tip shape for reconstructing AFM image
Shuai Yuan,, Lianqing Liu,, Lei Miao,, Zaili Dong,, Ning Xi,, Yuechao Wang,Year:
2009
Language:
english
DOI:
10.1109/NMDC.2009.5167574
File:
PDF, 390 KB
english, 2009