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[IEEE Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Buffalo, NY, USA (17-18 Oct. 2005)] Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Distance and Matching for Authentication by On-Line Signature
Wirotius, M., Ramel, J.Y., Vincent, N.Year:
2005
Language:
english
DOI:
10.1109/autoid.2005.19
File:
PDF, 223 KB
english, 2005