[IEEE 2014 53rd Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) - Sapporo, Japan (2014.9.9-2014.9.12)] 2014 Proceedings of the SICE Annual Conference (SICE) - An automatic visual inspection method based on supervised machine learning for rapid on-site evaluation in EUS-FNA
Inoue, Hirofumi, Ogo, Kazuki, Tabuchi, Motohiro, Yamane, Nobumoto, Oka, HisaoYear:
2014
Language:
english
DOI:
10.1109/sice.2014.6935253
File:
PDF, 1.87 MB
english, 2014