[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Dreams, Plans, and Journey of Reaching Perfect Predictability and Reliability in ASICs
Sherwani, NaveedYear:
2009
Language:
english
DOI:
10.1109/dft.2009.63
File:
PDF, 128 KB
english, 2009