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[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Characterization and reliability of 3D LSI and SiP
Lee, K-W., Murugesan, M., Bea, Jichel, Fukushima, T., Tanaka, T., Koyanagi, M.Year:
2013
Language:
english
DOI:
10.1109/iedm.2013.6724579
File:
PDF, 2.59 MB
english, 2013