[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - IRT: A modeling system for single event upset analysis that captures charge sharing effects
Foley, Kerryann, Seifert, Norbert, Velamala, Jyothi B., Bennett, William G., Gupta, ShashankYear:
2014
Language:
english
DOI:
10.1109/irps.2014.6861092
File:
PDF, 735 KB
english, 2014