[IEEE 2011 23rd International Conference on Microelectronics (ICM) - Hammamet, Tunisia (2011.12.19-2011.12.22)] ICM 2011 Proceeding - Improved Masek approach for iris localization
Aydi, Walid, Masmoudi, Nouri, Kamoun, LotfiYear:
2011
Language:
english
DOI:
10.1109/ICM.2011.6177389
File:
PDF, 1.64 MB
english, 2011