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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - 3-D Monte Carlo simulations of FinFETs
Kathawala, G.A., Ravaioli, U.Year:
2003
Language:
english
DOI:
10.1109/iedm.2003.1269372
File:
PDF, 258 KB
english, 2003