[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Correlation between interface traps and gate leakage current in ultrathin silicon dioxides
Wei-Yip Loh,, Byung-Jin Cho,Year:
2002
Language:
english
DOI:
10.1109/ipfa.2002.1025672
File:
PDF, 446 KB
english, 2002