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[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns
Wang, Seongmoon, Wei, WenlongYear:
2008
Language:
english
DOI:
10.1109/ets.2008.12
File:
PDF, 222 KB
english, 2008