[IEEE 1994 IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (22-25 March 1994)] Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures - Development of the test insert generating expert routine (TIGER) for BiCMOS technologies
Tarasewicz, S.W., Horner, R.A.Year:
1994
Language:
english
DOI:
10.1109/ICMTS.1994.303480
File:
PDF, 420 KB
english, 1994