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Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs
Sang-Hyun Oh,, Monroe, D., Hergenrother, J.M.Volume:
21
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.863106
Date:
September, 2000
File:
PDF, 101 KB
english, 2000