[IEEE 1997 55th Annual Device Research Conference Digest -...

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[IEEE 1997 55th Annual Device Research Conference Digest - Fort Collins, CO, USA (23-25 June 1997)] 1997 55th Annual Device Research Conference Digest - Comparative study of several anti-punchthrough designs for buried channel PMOSFET

Jeonghwan Son,, Seungho Lee,, Kijae Huh,, Wouns Yang,, Youngjong Lee,, Jeongmo Hwang,
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Year:
1997
Language:
english
DOI:
10.1109/drc.1997.612458
File:
PDF, 168 KB
english, 1997
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