[IEEE 2013 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2013.06.5-2013.06.6)] 2013 IEEE International Meeting for Future of Electron Devices, Kansai - A CMOS image sensor with low fixed pattern noise suitable for lensless observation system of digital enzyme-linked immunosorbent assay (ELISA)
Takehara, Hironari, Miyazawa, Kazuya, Noda, Toshihiko, Sasagawa, Kiyotaka, Tokuda, Takashi, Kim, Soo Hyeon, Iino, Ryota, Noji, Hiroyuki, Ohta, JunYear:
2013
Language:
english
DOI:
10.1109/imfedk.2013.6602227
File:
PDF, 714 KB
english, 2013