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[IEEE 2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] - Portland, OR, USA (2007.10.14-2007.10.14)] 2007 ROCS Workshop[Reliability of Compound Semiconductors Digest] - Method for Accelerated Determination of GaAs PHEMT Power Slump Reliability
Yeats, BobYear:
2007
Language:
english
DOI:
10.1109/rocs.2007.4391056
File:
PDF, 12.38 MB
english, 2007