Transient reflectivity as a probe of ultrafast carrier dynamics in semiconductors: A revised model for low-temperature grown GaAs
Wells, Nathan P., Belden, Paul M., Demers, Joseph R., Lotshaw, William T.Volume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4892868
Date:
August, 2014
File:
PDF, 1.38 MB
english, 2014