[IEEE 2009 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2009 IEEE International Test...

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - An outlier detection based approach for PCB testing

He, Xin, Malaiya, Yashwant, Jayasumana, Anura P., Parker, Kenneth P., Hird, Stephen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/test.2009.5355761
File:
PDF, 961 KB
english, 2009
Conversion to is in progress
Conversion to is failed