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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - An outlier detection based approach for PCB testing
He, Xin, Malaiya, Yashwant, Jayasumana, Anura P., Parker, Kenneth P., Hird, StephenYear:
2009
Language:
english
DOI:
10.1109/test.2009.5355761
File:
PDF, 961 KB
english, 2009