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[IEEE 2010 2nd International Conference on Computer Engineering and Technology - Chengdu, China (2010.04.16-2010.04.18)] 2010 2nd International Conference on Computer Engineering and Technology - An EMF activity tree based BPEL defect pattern testing method
Junfei Huang,, Gong, YunzhanYear:
2010
Language:
english
DOI:
10.1109/iccet.2010.5485536
File:
PDF, 151 KB
english, 2010