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Analyzing real-time surface modification of operating semiconductor laser diodes using cross-sectional scanning tunneling microscopy
Cobley, R. J., Rees, P., Teng, K. S., Wilks, S. P.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3380826
File:
PDF, 469 KB
english, 2010