Analog Negative-Bias-Temperature-Instability Monitoring...

IEEE Transactions on Device and Materials Reliability 2012 / 03 Vol. 12; Iss. 1

Analog Negative-Bias-Temperature-Instability Monitoring Circuit

Yelten, Mustafa Berke, Franzon, Paul D., Steer, Michael B.
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Volume:
12
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2011.2178096
Date:
March, 2012
File:
PDF, 208 KB
english, 2012
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