[IEEE 2006 International Symposium on Plant Growth...

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[IEEE 2006 International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications (PMA) - Beijing, China (2006.11.13-2006.11.17)] 2006 Second International Symposium on Plant Growth Modeling and Applications - Architectural and Geometrical Representations of Cotton Plants to Simulate Their Light Interception at Low Density

Martin, Pierre, Clouvel, Pascal, Luquet, Delphine, Dauzat, Jean
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Year:
2006
Language:
english
DOI:
10.1109/pma.2006.55
File:
PDF, 1.28 MB
english, 2006
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