Hierarchical cluster analysis for exposure assessment of...

American Journal of Industrial Medicine 1995 Vol. 28; Iss. 6

Hierarchical cluster analysis for exposure assessment of workers in the semiconductor health study

Cynthia J. Hines, Steve Selvin, Steven J. Samuels, S. Katharine Hammond, Susan R. Woskie, Marilyn F. Hallock, Marc B. Schenker
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Volume:
28
Year:
1995
Language:
english
Pages:
10
DOI:
10.1002/ajim.4700280607
File:
PDF, 567 KB
english, 1995
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