[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Experimental and theoretical analysis of hole transport in uniaxially strained pMOSFETs
Huet, K., Feraille, M., Rideau, D., Delamare, R., Aubry-Fortuna, V., Kasbari, M., Blayac, S., Rivero, C., Bournel, A., Tavernier, C., Dollfus, P., Jaouen, H.Year:
2008
Language:
english
DOI:
10.1109/ESSDERC.2008.4681741
File:
PDF, 554 KB
english, 2008