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[IEEE 2006 30th Annual International Computer Software and Applications Conference (COMPSAC '06 Supplement) - Chicago, IL, USA (2006.09.17-2006.09.21)] 2006 30th Annual International Computer Software and Applications Conference (COMPSAC '06 Supplement) - Design Structural Stability Metrics and Post-Release Defect Density: An Empirical Study
Elish, Mahmoud, Rine, DavidYear:
2006
Language:
english
DOI:
10.1109/compsac.2006.261038
File:
PDF, 266 KB
english, 2006