[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study
Haihua Yan,, Singh, A.D.Year:
2004
Language:
english
DOI:
10.1109/test.2004.1386958
File:
PDF, 554 KB
english, 2004