![](/img/cover-not-exists.png)
[IEEE 2008 IEEE International Conference on Computer Design (ICCD) - Lake Tahoe, CA, USA (2008.10.12-2008.10.15)] 2008 IEEE International Conference on Computer Design - Power-aware soft error hardening via selective voltage scaling
Kai-Chiang Wu,, Marculescu, DianaYear:
2008
Language:
english
DOI:
10.1109/iccd.2008.4751877
File:
PDF, 796 KB
english, 2008