In situ Observations and Quantitative Analysis of Short...

IEEE Transactions on Device and Materials Reliability 2010 / 09 Vol. 10; Iss. 3

In situ Observations and Quantitative Analysis of Short Circuit Probability Due to Ultrahigh Frequency Fatigue

Eberl, Christoph, Riesch-Oppermann, Heinz, Spolenak, Ralph, Kubat, Franz, Ruile, Werner, Courty, Diana, Kraft, Oliver
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2010.2047945
Date:
September, 2010
File:
PDF, 792 KB
english, 2010
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