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[IEEE 2006 International Conference on Applied Electronics - Pilsen, Czech Republic (2006.09.6-2006.09.7)] 2006 International Conference on Applied Electronics - Study of influences on the changes of the surface tension
Dusek, Karel, Urbanek, JanYear:
2006
Language:
english
DOI:
10.1109/ae.2006.4382959
File:
PDF, 3.26 MB
english, 2006