Defect classification using a new feature for pulsed eddy...

NDT & E International 2005 Vol. 38; Iss. 1

Defect classification using a new feature for pulsed eddy current sensors

Gui Yun Tian, Ali Sophian
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Volume:
38
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.ndteint.2004.06.001
File:
PDF, 249 KB
english, 2005
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