Research on edge identification of a defect using pulsed...

Research on edge identification of a defect using pulsed eddy current based on principal component analysis

Yang BinFeng, Luo FeiLu, Han Dan
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Volume:
40
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.ndteint.2006.12.005
File:
PDF, 524 KB
english, 2007
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