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[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - The Use of the Manufacturing Sensitivity Model Forms to Comprehend Layout Manufacturing Robustness For Use During Device Design
Melvin, L.S., Zhang, D.N., Strozewski, K.J., Wolfer, S.Year:
2006
Language:
english
DOI:
10.1109/ISQED.2006.135
File:
PDF, 310 KB
english, 2006