Defect edge identification with rectangular pulsed eddy current sensor based on transient response signals
Yunze He, Feilu Luo, Mengchun Pan, Xiangchao Hu, Bo Liu, Junzhe GaoVolume:
43
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.ndteint.2010.03.007
File:
PDF, 1.51 MB
english, 2010