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[IEEE 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (Feb 12-16 2006)] 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop - Cycling behavior of nitride charge profile in NROM-type memory cells
Furnemont, A., Rosmeulen, M., Van Houdt, J., Maes, H., De Meyer, K.Year:
2006
Language:
english
DOI:
10.1109/.2006.1629497
File:
PDF, 642 KB
english, 2006