[IEEE 2014 72nd Annual Device Research Conference (DRC) -...

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[IEEE 2014 72nd Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2014.6.22-2014.6.25)] 72nd Device Research Conference - Band-to-band tunneling in MOS-capacitors for rapid tunnel-FET characterization

Smets, Q., Verhulst, A. S., Lin, D. H.-C., Verreck, D., Merckling, C., Kazzi, S. El, Martens, K., Raskin, J-P., Thean, V.-Y., Heyns, M. M.
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Year:
2014
Language:
english
DOI:
10.1109/drc.2014.6872298
File:
PDF, 270 KB
english, 2014
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