Refractive index profiling-state of the art

Raine, K.W., Baines, J.G.N., Putland, D.E.

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Volume:

Language:

english

Journal:

Journal of Lightwave Technology

DOI:

10.1109/50.32377

Date:

January, 1989

File:

PDF, 855 KB

english, 1989

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